To design complex ASICs in a timely and cost-effective manner, engineers must incorporate various design-for-test (DFT) methodologies. Early on, for example, they must add boundary as well as internal ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Complex system-on-chip (SoC) devices make every stage of the development flow harder, and the challenges continue even after the silicon is fabricated. Automatic test equipment (ATE) screening for ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Memory-efficient, multithreaded engines utilize available server cores to speed up automatic test pattern generation (ATPG) and silicon diagnosis Twenty-five percent fewer test patterns reduce test ...

For over 35 years, Army weapon systems have relied on automatic test systems to diagnose and isolate platform failures. Two kinds of systems, at-platform automatic test systems (APATS) and ...