Yahoo Finance

Advantest to Showcase Design-to-Test Automation Using Velocity™ Software at VOICE 2026

TOKYO, May 18, 2026 (GLOBE NEWSWIRE) -- Advantest Corporation (TSE Prime: 6857), a global leader in semiconductor test solutions, today announced it will showcase the integration of AllianceATE’s ...
Electronic Design

Using Timing Constraints For Generating At-Speed Test Patterns

Handling timing exception paths in ATPG tools while creating at-speed patterns has always been a tough and tricky task. It is well understood that at-speed testing is a requirement for modern ...
Semiconductor Engineering

AI-Driven Test Optimization Solves Semiconductor Test Costs And Design Schedules

Artificial Intelligence has become a pervasive technology that is being applied to solve today’s complex problems, especially in the areas involving exponentially large amounts of data, their analysis ...
InfoQ

Three Key Success Factors for Improving Test Automation Outcomes

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Dany Lepage discusses the architectural ...
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...