Functional printed-circuit-board (PCB) test has had a seesaw relationship with other board-test techniques. When surface-mount parts and ball-grid arrays first appeared, limited circuit-node access ...

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...

With the rapid growth in semiconductor content in today’s vehicles, IC designers need to improve their process of meeting functional safety requirements defined by the ISO 26262 standard. The ISO ...

The evolutionary path of semiconductor ATE (automated test equipment) seemed clear at Semicon West, held July 13–15 in San Francisco. Gone are the expensive, big-iron functional testers of yesterday, ...