There is considerable ongoing discussion on how to contain exponentially increasing test costs for systems-on-chip (SoCs) and microprocessors. As the transistor geometry shrinks and more transistors ...

Testing multiple devices in parallel using the same ATE results in reduced test time and lower costs, but it requires engineering finesse to make it so. Minimizing test measurement variation for each ...

Time is money in electronics, as in other industries, and the more time that is invested in testing chips means more costs being added to the product in question. To speed up testing for memory ...

Increased device complexity can be addressed by providing parallel test while decreasing the throughput overhead of the ATE architecture. The consumer world is converging, and the lines between ...

2008 promises to be an exciting year for the wireless industry, in particular because many multiple-input multiple-output (MIMO) devices will ramp into high-volume production, enabling increases in ...