For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...

Failures have been present in electronic products since the days of vacuum tubes, and despite enormous development and production improvements, no manufacturing technique can guarantee a 100% ...