This webinar will cover three widely used high-resolution microscopy techniques that deliver nanoscale insights: scanning electron microscopy (SEM), transmission electron microscopy (TEM), and ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Scanning Thermal Microscopy (SThM) has emerged as a pivotal technique for mapping temperature fields and thermal properties with nanometre‐scale resolution. By integrating a heated or ...

Lithium ion batteries dominate the energy storage sector from the scale of small portable devices to electric vehicles and even grid-scale electricity suppliers. Research is constantly ongoing to ...

Definition: Kelvin Probe Force Microscopy (KPFM), also known as Surface Potential Microscopy, is a cutting-edge scanning probe microscopy technique that measures the surface potential of materials at ...

The biggest challenge with SPM is that the SPM data quality is inherently linked to the tip quality. As we all know, since its inception, SPM has become one of the go-to methods for nanoscale ...

The work was supported by the World Premier International Research Center Initiative (WPI), MEXT, Japan, JSPS Grants-in-Aid for Scientific Research (21H01770, 22K04890). The principle of scanning ion ...