Statistical process control (SPC) represents a suite of methodologies aimed at monitoring and maintaining the quality of manufacturing processes through the systematic collection and analysis of data.

The Shewhart chart is named after Walter A. Shewhart (1891-1967), a physicist at the Bell Telephone Laboratories, who introduced the method in 1924 and elaborated upon it in his book Economic Control ...

The author outlines key considerations for carrying out a structured approach to monitoring process performance and ensuring product quality. Routine, ongoing assessment of process performance and ...

There are many different approaches for assessing process parameter criticality, and assessing which process parameters have a significant impact on critical quality attributes (CQAs) is a particular ...