Today’s highly complex and large system on chip (SoC) devices and systems present many challenges to be addressed from manufacturing tests to the field while meeting stringent requirements for test ...

In-field testing is essential for quickly detecting emerging defects throughout a device's operational lifespan.

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...

New liquid-cooling enabled system delivers affordable, high-density SLT and burn-in test for high-demand, lower-volume HPC, AI, and automotive devices TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading ...

Revel Software Corp., a startup that develops software for complex physical systems such as jet engines, has raised $150 million in funding. The company announced the investment today. It said Index ...

TOKYO, Sept. 18, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its 7038 Single Test Rack (STR) system-level test (SLT) and ...

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As circuit cards become denser and larger, it is becoming harder to locate faults and even individual parts on them. The movement away from through-hole toward 100% surface-mount technology has led to ...